GRAIL 10-HVT-X
I realized the high temperature measurements,the high-voitage environments.
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Applications
Power device measurement(Sic,Diamond etc)
Specification
Item | GRAIL 10-HVT-X |
Equipment configuration | Power device prober main unit 1 set |
Prove body outline dimensions | 960(W)×720(D)×600(H) |
Weight | Prober main unit:150Kg around |
Cooling method | N2 gas circulation(for return to room temperature) |
Measured temperature range | RT~573K |
Withstand voltage measurement Withstand current measurement |
3kV, Pls20A |
Possible measured Area | <25mm x 25mm |
Probe mobility | X-axis:±25.0mm Y,Z-axis:±12.5mm |
Temperature Stability | Within ±1.0 :RT~573K |
Measurement noise | < ±1pA(at room teperature 40V) |
Probe head | 0~6 pieces *1 |
Sample Stage mobility | No transferring machanism |
Signal connector | MHV(SHV)connector x (probe quantity+2) *2 |
Options that can be mounted etc... *3 | High-frequency wave kit *4 |
*1) I represents the number of portions of the "X"
*2) +2 is for the back gate
*3) There is a casa where the basic specifications are subject to change
*4) Also available to special specifications