Business for Low-temperature and vacuum related equipment, Chemical management & recycling systems, Surface analysis systems and Other devices

Exhibited at the Japan Society of Applied Physics (JSAP) Expo Spring 2012

August 1, 2012

Period: Sep. 11th (Tue.) to 14th (Fri.), 2012
Venue: Ehime University, Johoku Campus
Exhibited Items: Low-temperature Vacuum Prober, Wafer Handling Tools Panel Display